The focus of recent meta-learning research has been on the development of learning algorithms that can quickly adapt to test time tasks with limited data and low computational cost. Few-shot learning is widely used as one of the standard benchmarks in meta-learning. In this work, we show that a simple baseline: learning a supervised or self-supervised representation on the meta-training set, followed by training a linear classifier on top of this representation, outperforms state-of-the-art few-shot learning methods. An additional boost can be achieved through the use of self-distillation. This demonstrates that using a good learned embedding model can be more effective than sophisticated meta-learning algorithms. We believe that our findings motivate a rethinking of few-shot image classification benchmarks and the associated role of meta-learning algorithms. Code is available at: http://github.com/WangYueFt/rfs/.
Rethinking Few-Shot Image Classification: a Good Embedding Is All You Need?
A simple baseline combining supervised or self-supervised learning with a linear classifier and self-distillation achieves superior performance in few-shot learning compared to advanced meta-learning methods, suggesting a reevaluation of few-shot learning benchmarks.
- Year
- 2020
- Venue
- ECCV 2020 8
- Authors
- 5
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- Abstract onlyARXIV-DEFAULT
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- arxiv.org/abs/2003.11539v2ARXIV-DEFAULT
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